V. Born

Publication Activity (10 Years)

Years Active: 2009-2009
Publications (10 Years): 0

Publications

V. Born, M. Beck, O. Bosholm, D. Dalleau, S. Glenz, I. Haverkamp, G. Kurz, F. Lange, A. Vest
Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity. Microelectron. Reliab. 49 (1) (2009)