Sign in
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters.
Daniel Arbet
Gábor Gyepes
Juraj Brenkus
Viera Stopjaková
Published in:
DDECS (2012)
Keyphrases
</>
test cases
computational complexity
edge detection
parametric models
real time
neural network
fault diagnosis
noise reduction
statistical tests
fault detection
test sequences
finite impulse response
mutation testing
built in self test