Gábor Gyepes

Publication Activity (10 Years)

Years Active: 2011-2022
Publications (10 Years): 1

Top Topics

Cross Disciplinary

High Efficiency

Calculation Method

Top Venues

RADIOELEKTRONIKA

Microprocess. Microsystems

Microelectron. Reliab.

Publications

Ondrej Kachman, Jakub Findura, Marcel Baláz, Gábor Gyepes, Libor Majer, Marian Vojs
Intelligent Monitoring System for Universal Data Collection and Analysis. RADIOELEKTRONIKA (2022)
Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus
test approach and its efficiency in covering resistive opens in SRAM arrays. Microprocess. Microsystems 38 (5) (2014)
Daniel Arbet, Viera Stopjaková, Juraj Brenkus, Gábor Gyepes, Martin Kovác, Libor Majer
BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. Microelectron. Reliab. 54 (5) (2014)
Juraj Brenkus, Viera Stopjaková, Daniel Arbet, Gábor Gyepes, Libor Majer
A novel impedance calculation method and its time efficiency evaluation. DDECS (2014)
Juraj Brenkus, Viera Stopjaková, Gábor Gyepes
Numerical method for DC fault analysis simplification and simulation time reduction. DDECS (2013)
Daniel Arbet, Gabriel Nagy, Viera Stopjaková, Gábor Gyepes
Efficiency of oscillation-based BIST in 90nm CMOS active analog filters. DDECS (2013)
Daniel Arbet, Gábor Gyepes, Juraj Brenkus, Viera Stopjaková
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. DDECS (2012)
Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková
Application of IDDT test towards increasing SRAM reliability in nanometer technologies. DDECS (2012)
Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková
Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. DDECS (2011)
Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. DDECS (2011)