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BIST architecture for oscillation test of analog ICs and investigation of test hardware influence.

Daniel ArbetViera StopjakováJuraj BrenkusGábor GyepesMartin KovácLibor Majer
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • real time
  • database
  • image processing
  • pipeline architecture
  • neural network
  • signal processing
  • computer systems
  • test data
  • data acquisition