Daniel Arbet

Publication Activity (10 Years)

Years Active: 2011-2023
Publications (10 Years): 39

Top Topics

Cmos Technology

Top Venues

Publications

Martin Kovác, Miroslav Potocný, Daniel Arbet, Róbert Ondica, Richard Ravasz, Viera Stopjaková
Low-Power CMOS Frequency Comparator. MIPRO (2023)
Richard Ravasz, David Maljar, Daniel Arbet, Viera Stopjaková, Peter Kubinec
Design of the Slope Detection Circuit for On-Chip Current Sensing. MIXDES (2023)
Tomasz Kulej, Montree Kumngern, Fabian Khateb, Daniel Arbet
0.5 V Versatile Voltage- and Transconductance-Mode Analog Filter Using Differential Difference Transconductance Amplifier. Sensors 23 (2) (2023)
Tomasz Kulej, Fabian Khateb, Daniel Arbet, Viera Stopjaková
A 0.3-V High Linear Rail-to-Rail Bulk-Driven OTA in 0.13 μm CMOS. IEEE Trans. Circuits Syst. II Express Briefs 69 (4) (2022)
David Maljar, Daniel Arbet, Martin Kovác, Róbert Ondica, Viera Stopjaková
Autocalibration Approach for Improving Robustness of Analog ICs. DDECS (2022)
Daniel Arbet, Martin Kovác, David Maljas, Lukás Nagy, Viera Stopjaková
High Power Supply Rejection LDO Regulator for Switching Applications. MIPRO (2022)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Michal Sovcik, Viera Stopjaková
Low-Power Rail-to-Rail Comparator in 130 nm CMOS Technology. RADIOELEKTRONIKA (2022)
Richard Ravasz, Adam Hudec, Daniel Arbet, Viera Stopjaková
On-Chip Current Sensing Approaches for DC-DC Converters. DDECS (2022)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Róbert Ondica, Viera Stopjaková
EKV Model for Bulk-Driven Circuit Design Using gmb/ID Method. AFRICON (2021)
David Maljar, Michal Sovcík, Daniel Arbet, Viera Stopjaková
Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration. DDECS (2021)
Róbert Ondica, Daniel Arbet, Martin Kovác, Viera Stopjaková
Investigation of Inductor-based Fully On-chip Boost Converter. MIXDES (2021)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Michal Sovcik, Viera Stopjaková
EKV MOS Transistor Model For Ultra Low-Voltage Bulk-Driven IC Design. DDECS (2021)
Daniel Arbet, Miroslav Potocný, Martin Kovác, Lukás Nagy, Viera Stopjaková
Fully On-Chip Low-Drop Regulator for Low-Power Applications. MIPRO (2021)
Miroslav Potocný, Martin Kovác, Daniel Arbet, Michal Sovcik, Lukás Nagy, Viera Stopjaková, Richard Ravasz
Low-Voltage DC-DC Converter for IoT and On-Chip Energy Harvester Applications. Sensors 21 (17) (2021)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Michal Sovcik, Viera Stopjaková
Dynamic Properties Of Ultra Low-Voltage Rail-to-Rail Comparator Designed In 130 nm CMOS Technology. DDECS (2020)
Michal Sovcík, Viera Stopjaková, Daniel Arbet, Miroslav Potocný
Autonomous On-Chip Digital Calibration for Analog ICs in Nanotechnologies. RADIOELEKTRONIKA (2020)
Martin Kovác, Daniel Arbet, Lukás Nagy, Michal Sovcik, Viera Stopjaková
Multi-Topology DC-DC Converter for Low-Voltage Energy Harvesting Systems. MIPRO (2020)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Viera Stopjaková
Ultra Low-Voltage Rail-to-Rail Comparator Design in 130 nm CMOS Technology. DDECS (2019)
Daniel Arbet, Martin Kovác, Viera Stopjaková, Miroslav Potocný
Voltage-to-Frequency Converter for Ultra-Low-Voltage Applications. MIPRO (2019)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Michal Sovcik, Viera Stopjaková
Performance Analysis Of Ultra Low-Voltage Rail-to-Rail Comparator In 130 nm CMOS Technology. AFRICON (2019)
Martin Kovác, Daniel Arbet, Viera Stopjaková, Michal Sovcik, Lukás Nagy
Investigation of Low-Voltage, Sub-threshold Charge Pump with Parasitics Aware Design Methodology. DDECS (2019)
Viera Stopjaková, Martin Kovác, Daniel Arbet, Lukás Nagy
Towards Energy-autonomous Integrated Systems Through Ultra-low Voltage Analog IC Design. MIXDES (2019)
Michal Sovcik, Martin Kovác, Daniel Arbet, Viera Stopjaková, Miroslav Potocný
Ultra-low-voltage boosted driver for self-powered systems. Microelectron. Reliab. 80 (2018)
Daniel Arbet, Martin Kovác, Viera Stopjaková, Miroslav Potocný
Bulk-driven fully differential difference amplifier for ultra-low voltage applications. MIPRO (2018)
Daniel Arbet, Martin Kovác, Lukás Nagy, Viera Stopjaková, Michal Sovcik
Two-Stage Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications. DDECS (2018)
Lukás Nagy, Daniel Arbet, Martin Kovác, Miroslav Potocný, Viera Stopjaková
Design and Performance Analysis of Ultra-Low Voltage Rail-to-Rail Comparator in 130 nm CMOS Technology. DDECS (2018)
Michal Sovcik, Martin Kovác, Daniel Arbet, Viera Stopjaková
Ultra-low-voltage driver for large load capacitance in 130nm CMOS technology. DDECS (2017)
Juraj Brenkus, Viera Stopjaková, Viera Cernanová, Daniel Arbet, Lukás Nagy, Vladimír Sedlák
A Novel Method Towards Time-Efficient Fault Analysis of Analog and Mixed-Signal Circuits. J. Circuits Syst. Comput. 26 (8) (2017)
Daniel Arbet, Viera Stopjaková, Martin Kovác, Lukás Nagy, Matej Rakus, Michal Sovcik
130 nm CMOS Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications. J. Circuits Syst. Comput. 26 (8) (2017)
Lukás Nagy, Daniel Arbet, Martin Kovác, Viera Stopjaková
Low-power bulk-driven rail-to-rail comparator in 130 nm CMOS technology. AFRICON (2017)
Matej Rakus, Viera Stopjaková, Daniel Arbet
Comparison of gate-driven and bulk-driven current mirror topologies. DDECS (2016)
Daniel Arbet, Martin Kovác, Lukás Nagy, Viera Stopjaková, Juraj Brenkus
Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology. DDECS (2016)
Daniel Arbet, Gabriel Nagy, Martin Kovác, Viera Stopjaková
Fully Differential Difference Amplifier for Low-Noise and Low-Distortion Applications. J. Circuits Syst. Comput. 25 (3) (2016)
Daniel Arbet, Martin Kovác, Lukás Nagy, Viera Stopjaková, Michal Sovcik
Variable-gain amplifier for ultra-low voltage applications in 130nm CMOS technology. MIPRO (2016)
Michal Sovcik, Michal Matuska, Daniel Arbet, Viera Stopjaková
CMOS variable-gain amplifier for low-frequency applications. DDECS (2016)
Juraj Brenkus, Viera Stopjaková, Lukás Nagy, Daniel Arbet
Impedance calculation based method for AC fault analysis of mixed-signal circuits. DDECS (2016)
Daniel Arbet, Viera Stopjaková, Martin Kovác
Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach. Microelectron. Reliab. 55 (7) (2015)
Daniel Arbet, Gabriel Nagy, Martin Kovác, Viera Stopjaková, Lukás Nagy
Readout interface for capacitive MEMS microphone in CMOS technology. MIXDES (2015)
Daniel Arbet, Gabriel Nagy, Martin Kovác, Viera Stopjaková
Fully Differential Difference Amplifier for Low-Noise Applications. DDECS (2015)
Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus
test approach and its efficiency in covering resistive opens in SRAM arrays. Microprocess. Microsystems 38 (5) (2014)
Daniel Arbet, Viera Stopjaková, Juraj Brenkus, Gábor Gyepes, Martin Kovác, Libor Majer
BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. Microelectron. Reliab. 54 (5) (2014)
Martin Kovác, Daniel Arbet, Gabriel Nagy, Viera Stopjaková
An approach towards selection of the oscillation frequency for oscillation test of analog ICs. DDECS (2014)
Juraj Brenkus, Viera Stopjaková, Daniel Arbet, Gábor Gyepes, Libor Majer
A novel impedance calculation method and its time efficiency evaluation. DDECS (2014)
Gabriel Nagy, Daniel Arbet, Viera Stopjaková
Digital methods of offset compensation in 90nm CMOS operational amplifiers. DDECS (2013)
Daniel Arbet, Gabriel Nagy, Viera Stopjaková, Gábor Gyepes
Efficiency of oscillation-based BIST in 90nm CMOS active analog filters. DDECS (2013)
Daniel Arbet, Gábor Gyepes, Juraj Brenkus, Viera Stopjaková
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. DDECS (2012)
Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková
Application of IDDT test towards increasing SRAM reliability in nanometer technologies. DDECS (2012)
Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková
Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. DDECS (2011)
Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. DDECS (2011)