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Application of IDDT test towards increasing SRAM reliability in nanometer technologies.

Gábor GyepesDaniel ArbetJuraj BrenkusViera Stopjaková
Published in: DDECS (2012)
Keyphrases
  • information systems
  • application specific
  • real time
  • neural network
  • web services
  • digital libraries
  • mobile devices
  • data management
  • decision support
  • test data
  • power consumption
  • key technologies
  • web technologies