PARAMETER IDENTIFICATION
Experts
- Witold Pedrycz
- Sung-Kwun Oh
- Paul M. J. Van den Hof
- Hossein Nezamabadi-pour
- Michel Verhaegen
- Maxime Gautier
- Hak-Keung Lam
- Brian D. O. Anderson
- Feng Ding
- Guy Albert Dumont
- Michel Gevers
- Igor Skrjanc
- Andreas Rauh
- Jan-Willem van Wingerden
- Alireza Karimi
- Chaoshun Li
- Graham C. Goodwin
- Lennart Ljung
- Franky De Bruyne
- Akira Sano
- Jose M. Carmena
- Enmin Feng
- Morteza Alinia Ahandani
- HÃ¥kan Hjalmarsson
- Hiromitsu Ohmori
- Ioan Doré Landau
- Silvio Traversaro
- John Mark Ansermino
- John Lygeros
- Shen Yin
- Dennis S. Bernstein
- Robert Babuska
- Raquel Urtasun
- Aizhu Zhang
- Patricia Melin
- Keon-Jun Park
- Alessandro Chiuso
- Hao Luo
- Miroslav Pajic
Venues
- CoRR
- ACC
- CDC
- Autom.
- IEEE Access
- ICRA
- IEEE Trans. Ind. Electron.
- ECC
- Sensors
- IROS
- EMBC
- IEEE Trans. Autom. Control.
- IECON
- Appl. Soft Comput.
- FUZZ-IEEE
- IEEE Trans. Biomed. Eng.
- Expert Syst. Appl.
- IEEE Trans. Instrum. Meas.
- Fuzzy Sets Syst.
- ISCAS
- IEEE Trans. Fuzzy Syst.
- IEEE Trans. Control. Syst. Technol.
- Eng. Appl. Artif. Intell.
- SMC
- NER
- J. Intell. Fuzzy Syst.
- Comput. Chem. Eng.
- IEEE Robotics Autom. Lett.
- BioCAS
- Inf. Sci.
- J. Frankl. Inst.
- ICASSP
- IEEE J. Solid State Circuits
- AIM
- Appl. Math. Comput.
- Neural Comput. Appl.
- ROBIO
- Int. J. Control
- Int. J. Model. Identif. Control.
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