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Experts
- Marc Pollefeys
- Agostino Martinelli
- Richard Szeliski
- Satoshi Goto
- Guofeng Zhang
- John Oliensis
- John S. Zelek
- Yoshiaki Shirai
- Janne Heikkilä
- Alessio Del Bue
- Hainan Cui
- Takeshi Ikenaga
- Vladislav Voroninski
- Hujun Bao
- Weibo Huang
- Stefano Soatto
- Shuhan Shen
- Zhenyu Liu
- Yang Song
- Takeo Kanade
- Jindong Tan
- Zhengyou Zhang
- Hongsheng He
- Jiancheng Fang
- Pierre-Louis Bazin
- Tien-Tsin Wong
- Pei-Yin Chen
- Oliver Amft
- Paolo Robuffo Giordano
- Shuangquan Wang
- Davide Scaramuzza
- Peter N. Belhumeur
- Huiyu Zhou
- Gim Hee Lee
- Adel H. Fakih
- Zilong Dong
- Kris M. Kitani
- Steven M. Seitz
- Sing Bing Kang
Venues
- CoRR
- Sensors
- CVPR
- Remote. Sens.
- ICRA
- IROS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IEEE Trans. Instrum. Meas.
- ICIP
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- IEEE Trans. Image Process.
- EMBC
- IGARSS
- ICPR
- Int. J. Comput. Vis.
- ROBIO
- Comput. Vis. Image Underst.
- IEEE Robotics Autom. Lett.
- 3DV
- ACC
- ICIP (2)
- IEEE Trans. Consumer Electron.
- VCIP
- BSN
- ICME
- IEEE Access
- MVA
- IPIN
- ECCV (2)
- Multim. Tools Appl.
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- SIAM J. Numer. Anal.
- SIAM J. Sci. Comput.
- Image Vis. Comput.
- Adv. Robotics
- Int. J. Comput. Math.
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