Takumi Uezono

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 8

Top Topics

Diagnostic Tests

Destination Node

Top Venues

J. Electron. Test.

Publications

Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto
Vulnerability Estimation of DNN Model Parameters with Few Fault Injections. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 106 (3) (2023)
Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Subrata Kumar Kundu
An Intelligent Diagnostic Technique for Reliable Operation of Edge AI. ITSC (2023)
Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto
Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections. DATE (2022)
Takumi Uezono, Yi He, Yanjing Li
Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators. ITC (2022)
Yi He, Takumi Uezono, Yanjing Li
Efficient Functional In-Field Self-Test for Deep Learning Accelerators. ITC (2021)
Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto
Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing. ITC (2020)
Takumi Uezono, Tadanobu Toba, Ken-ichi Shimbo, Fumihiko Nagasaki, Kenji Kawamura
Evaluation Technique for Soft-Error Rate in Terrestrial Environment Utilizing Low-Energy Neutron Irradiation. ATS (2016)
Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, Takashi Sato
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing. J. Electron. Test. 32 (5) (2016)
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato
A Variability-Aware Adaptive Test Flow for Test Quality Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (7) (2014)
Takumi Uezono, Kazuya Masu, Takashi Sato
A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation. IEICE Trans. Electron. (3) (2010)
Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu
Decomposition of drain-current variation into gain-factor and threshold voltage variations. ISCAS (2010)
Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
Scan based process parameter estimation through path-delay inequalities. ISCAS (2010)
Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
Path clustering for adaptive test. VTS (2010)
Takumi Uezono, Takashi Sato, Kazuya Masu
One-Shot Voltage-Measurement Circuit Utilizing Process Variation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (4) (2009)
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu
An Adaptive Test for Parametric Faults Based on Statistical Timing Information. Asian Test Symposium (2009)
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (4) (2008)
Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED (2007)
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
Improvement of power distribution network using correlation-based regression analysis. ACM Great Lakes Symposium on VLSI (2007)
Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu
Adaptable wire-length distribution with tunable occupation probability. SLIP (2007)
Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu
Weakness Identification for Effective Repair of Power Distribution Network. PATMOS (2007)
Kenichi Okada, Takumi Uezono, Kazuya Masu
Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology. PATMOS (2006)
Takumi Uezono, Kenichi Okada, Kazuya Masu
Via Distribution Model for Yield Estimation. ISQED (2006)
Takumi Uezono, Kenichi Okada, Kazuya Masu
Statistical Modeling of a Via Distribution for Yield Estimation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2006)
Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu
Wire Length Distribution Model Considering Core Utilization for System on Chip. ISVLSI (2005)
Junpei Inoue, Hiroyuki Ito, Shinichiro Gomi, Takanori Kyogoku, Takumi Uezono, Kenichi Okada, Kazuya Masu
Evaluation of on-chip transmission line interconnect using wire length distribution. ASP-DAC (2005)
Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu
Wire Length Distribution Model for System LSI. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2005)
Takumi Uezono, Junpei Inoue, Takanori Kyogoku, Kenichi Okada, Kazuya Masu
Prediction of delay time for future LSI using on-chip transmission line interconnects. SLIP (2005)