Scan based process parameter estimation through path-delay inequalities.
Takumi UezonoTomoyuki TakahashiMichihiro ShintaniKazumi HatayamaKazuya MasuHiroyuki OchiTakashi SatoPublished in: ISCAS (2010)
Keyphrases
- parameter estimation
- maximum likelihood
- least squares
- model selection
- statistical models
- parameter estimation algorithm
- random fields
- markov random field
- em algorithm
- shortest path
- parameter values
- model fitting
- higher order
- machine learning
- expectation maximization
- computer vision
- posterior distribution
- approximate inference
- parameters estimation
- data mining