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Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing.
Michihiro Shintani
Takumi Uezono
Kazumi Hatayama
Kazuya Masu
Takashi Sato
Published in:
J. Electron. Test. (2016)
Keyphrases
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shortest path
clustering algorithm
clustering method
statistical tests
graph theoretic
pattern discovery
destination node
feature selection
anomaly detection
test cases
pattern matching
self organizing maps
endpoints
path length
regression testing