Login / Signup

One-Shot Voltage-Measurement Circuit Utilizing Process Variation.

Takumi UezonoTakashi SatoKazuya Masu
Published in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2009)
Keyphrases
  • development process
  • database
  • real time
  • high speed
  • power system
  • neural network
  • artificial intelligence
  • e learning
  • design process