Octavian Buiu

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 4

Top Topics

Fiber Bragg Grating

Top Venues

Publications

Radu C. Popa, Cosmin-Andrei Serban, Andrei Barborica, Ana-Maria Zagrean, Octavian Buiu, Niculae Dumbravescu, Alexandru-Catalin Paslaru, Cosmin Obreja, Cristina Pachiu, Marius Stoian, Catalin Marculescu, Antonio Radoi, Silviu Vulpe, Marian Ion
Functional Enhancement and Characterization of an Electrophysiological Mapping Electrode Probe with Carbonic, Directional Macrocontacts. Sensors 23 (17) (2023)
Bogdan-Catalin Serban, Cornel Cobianu, Niculae Dumbravescu, Octavian Buiu, Marius Bumbac, Cristina Mihaela Nicolescu, Cosmin Cobianu, Mihai Brezeanu, Cristina Pachiu, Matei Serbanescu
Electrical Percolation Threshold and Size Effects in Polyvinylpyrrolidone-Oxidized Single-Wall Carbon Nanohorn Nanocomposite: The Impact for Relative Humidity Resistive Sensors Design. Sensors 21 (4) (2021)
Octavian Ionescu, Viorel Dumitru, Emil Pricop, Octavian Buiu, Cornel Cobianu, Mihai Raneti, Stefan Pircalabu, Costin Marica
On the development of a robust cyber security system for Internet of Things devices. ECAI (2019)
Viorel Avramescu, Andrea De Luca, Mihai Brezeanu, Syed Zeeshan Ali, Florin Udrea, Octavian Buiu, Cornel Cobianu, Bogdan-Catalin Serban, Julian Gardner, Viorel Dumitru, Alisa Stratulat
CMOS-compatible SOI micro-hotplate-based oxygen sensor. ESSDERC (2016)
Alisa Stratulat, Bogdan-Catalin Serban, Andrea De Luca, Viorel Avramescu, Cornel Cobianu, Mihai Brezeanu, Octavian Buiu, Lucian Diamandescu, Marcel Feder, Syed Zeeshan Ali, Florin Udrea
(STFO40). Sensors 15 (7) (2015)
V. V. N. Obreja, C. Codreanu, D. Poenar, Octavian Buiu
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic. Microelectron. Reliab. 51 (3) (2011)
Yajie Chen, Steve Hall, Liam McDaid, Octavian Buiu, Peter M. Kelly
A Solid-State Neuron for Spiking Neural Network Implementation. Eng. Lett. 16 (1) (2008)
Octavian Buiu, Steve Hall, Olof Engström, B. Raeissi, Max C. Lemme, Paul K. Hurley, Karim Cherkaoui
Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. Microelectron. Reliab. 47 (4-5) (2007)
Ivona Z. Mitrovic, Octavian Buiu, Steve Hall, C. Bungey, T. Wagner, W. Davey, Y. Lu
Electrical and structural properties of hafnium silicate thin films. Microelectron. Reliab. 47 (4-5) (2007)
P. Taechakumput, S. Taylor, Octavian Buiu, R. J. Potter, Paul R. Chalker, A. C. Jones
Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition. Microelectron. Reliab. 47 (4-5) (2007)
Yajie Chen, Steve Hall, Liam McDaid, Octavian Buiu, Peter M. Kelly
Analog Spiking Neuron with Charge-Coupled Synapses. World Congress on Engineering (2007)
Y. Lu, Octavian Buiu, Steve Hall, Ivona Z. Mitrovic, W. Davey, R. J. Potter, Paul R. Chalker
Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition. Microelectron. Reliab. 47 (4-5) (2007)
Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, Paul R. Chalker
-Si structures. Microelectron. Reliab. 47 (4-5) (2007)
Thomas Dowrick, Steve Hall, Liam McDaid, Octavian Buiu, Peter M. Kelly
A Biologically Plausible Neuron Circuit. IJCNN (2007)
I. P. Tyagulskyy, I. N. Osiyuk, V. S. Lysenko, A. N. Nazarov, Steve Hall, Octavian Buiu, Y. Lu, Richard Potter, Paul R. Chalker
/p-Si interfaces at cryogenic temperatures. Microelectron. Reliab. 47 (4-5) (2007)
Yajie Chen, Steve Hall, Liam McDaid, Octavian Buiu, Peter M. Kelly
On the Design of a Low Power Compact Spiking Neuron Cell Based on Charge-Coupled Synapses. IJCNN (2006)
Yajie Chen, Steve Hall, Liam McDaid, Octavian Buiu, Peter M. Kelly
A Silicon Synapse Based on a Charge Transfer Device for Spiking Neural Network Application. ISNN (2) (2006)
Y. Lu, Octavian Buiu, Steve Hall, Paul K. Hurley
Optical and electrical characterization of hafnium oxide deposited by MOCVD. Microelectron. Reliab. 45 (5-6) (2005)
K. I. Nuttall, Octavian Buiu, V. V. N. Obreja
Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectron. Reliab. 43 (9-11) (2003)