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Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic.
V. V. N. Obreja
C. Codreanu
D. Poenar
Octavian Buiu
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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adjacent regions
edge map
low voltage
multiscale
edge strength
failure prediction
short circuit
gallium arsenide