Karim Cherkaoui

Publication Activity (10 Years)

Years Active: 2007-2009
Publications (10 Years): 0

Publications

Enrique Miranda, Javier Martín-Martínez, Eamon O'Connor, G. Hughes, P. Casey, Karim Cherkaoui, S. Monaghan, R. Long, D. O'Connell, Paul K. Hurley
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Microelectron. Reliab. 49 (9-11) (2009)
Paul K. Hurley, Karim Cherkaoui, S. McDonnell, G. Hughes, A. W. Groenland
/TiN gate stacks. Microelectron. Reliab. 47 (8) (2007)
Octavian Buiu, Steve Hall, Olof Engström, B. Raeissi, Max C. Lemme, Paul K. Hurley, Karim Cherkaoui
Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. Microelectron. Reliab. 47 (4-5) (2007)
Richard A. Farrell, Karim Cherkaoui, Nikolay Petkov, Heinz Amenitsch, Justin D. Holmes, Paul K. Hurley, Michael A. Morris
Physical and electrical properties of low dielectric constant self-assembled mesoporous silica thin films. Microelectron. Reliab. 47 (4-5) (2007)