Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks.
Enrique MirandaJavier Martín-MartínezEamon O'ConnorG. HughesP. CaseyKarim CherkaouiS. MonaghanR. LongD. O'ConnellPaul K. HurleyPublished in: Microelectron. Reliab. (2009)