/TiN gate stacks.

Paul K. Hurley Karim Cherkaoui S. McDonnell G. Hughes A. W. Groenland

Published in: Microelectron. Reliab. (2007)

Keyphrases

nano scale
low cost
neural network
information systems
viewpoint
digital images
database
metadata
database systems
pattern recognition
user interface
multiresolution
co occurrence
response time
signal processing
printed circuit boards