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/p-Si interfaces at cryogenic temperatures.

I. P. TyagulskyyI. N. OsiyukV. S. LysenkoA. N. NazarovSteve HallOctavian BuiuY. LuRichard PotterPaul R. Chalker
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • low energy electron
  • visual interfaces
  • real time
  • databases
  • neural network
  • real world
  • information retrieval
  • artificial neural networks
  • user interface
  • thin film
  • metal oxide