Paul R. Chalker

Publication Activity (10 Years)

Years Active: 2007-2019
Publications (10 Years): 3

Top Topics

White Light Interferometry

Electrical Properties

Top Venues

Publications

Miao Cui, Yutao Cai, Qinglei Bu, Wen Liu, Huiqing Wen, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker, Cezhou Zhao
The Impact of Etch Depth of D-mode AlGaN/GaN MIS-HEMTs on DC and AC Characteristics of 10 V Input Direct-Coupled FET Logic (DCFL) Inverters. ICICDT (2019)
Yutao Cai, Yang Wang, Miao Cui, Wen Liu, Huiqing Wen, Cezhou Zhao, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker
Effect of High-k Passivation Layer on Electrical Properties of GaN Metal-Insulator-Semiconductor Devices. ICICDT (2019)
A. Shaw, T. J. Whittles, Ivona Z. Mitrovic, J. D. Jin, J. S. Wrench, D. Hesp, V. R. Dhanak, Paul R. Chalker, Steve Hall
Physical and electrical characterization of Mg-doped ZnO thin-film transistors. ESSDERC (2015)
P. Taechakumput, S. Taylor, Octavian Buiu, R. J. Potter, Paul R. Chalker, A. C. Jones
Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition. Microelectron. Reliab. 47 (4-5) (2007)
Y. Lu, Octavian Buiu, Steve Hall, Ivona Z. Mitrovic, W. Davey, R. J. Potter, Paul R. Chalker
Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition. Microelectron. Reliab. 47 (4-5) (2007)
Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, Paul R. Chalker
-Si structures. Microelectron. Reliab. 47 (4-5) (2007)
I. P. Tyagulskyy, I. N. Osiyuk, V. S. Lysenko, A. N. Nazarov, Steve Hall, Octavian Buiu, Y. Lu, Richard Potter, Paul R. Chalker
/p-Si interfaces at cryogenic temperatures. Microelectron. Reliab. 47 (4-5) (2007)