Manuel J. Barragan Asian

Publication Activity (10 Years)

Years Active: 2005-2017
Publications (10 Years): 2

Top Topics

Design Considerations

Top Venues

IEEE Trans. Instrum. Meas.

J. Low Power Electron.

Publications

Hani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Hervé Le Gall
Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology. ETS (2017)
Manuel J. Barragan Asian, Gildas Léger
A Procedure for Alternate Test Feature Design and Selection. IEEE Des. Test 32 (1) (2015)
Manuel J. Barragan Asian, Gildas Léger
Efficient selection of signatures for analog/RF alternate test. ETS (2013)
Manuel J. Barragan Asian, Gildas Léger, José Luis Huertas
Multi-condition alternate test of analog, mixed-signal, and RF systems. LATW (2012)
Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS. IEEE Trans. Instrum. Meas. 61 (8) (2012)
Manuel J. Barragan Asian, Gildas Léger, José L. Huertas
OBT for settling error test of sampled-data systems using signal-dependent clocking. ETS (2012)
Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
Digital Adaptive Calibration of Multi-Step Analog to Digital Converters. J. Low Power Electron. 8 (2) (2012)
Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Léger, Adoración Rueda, José L. Huertas
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. Asian Test Symposium (2011)
Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Léger, Adoración Rueda, José L. Huertas
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures. J. Electron. Test. 27 (3) (2011)
Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications. J. Electron. Test. 27 (3) (2011)
Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda
A BIST Solution for Frequency Domain Characterization of Analog Circuits. J. Electron. Test. 26 (4) (2010)
Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas
(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems. DELTA (2010)
Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas
Low-cost signature test of RF blocks based on envelope response analysis. ETS (2010)
Antonio J. Ginés, Ricardo Doldán, Manuel J. Barragan Asian, Adoración Rueda, Eduardo J. Peralías
On-chip biased voltage-controlled oscillator with temperature compensation of the oscillation amplitude for robust I/Q generation. ISCAS (2010)
Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas
A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis. Asian Test Symposium (2009)
Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda
Practical Implementation of a Network Analyzer for Analog BIST Applications. DATE (2008)
Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE (2007)
Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda
A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology. DDECS (2006)
Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragan Asian, Gildas Léger, Adoración Rueda, José Luis Huertas
Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST. J. Electron. Test. 21 (3) (2005)