A BIST Solution for Frequency Domain Characterization of Analog Circuits.
Manuel J. Barragan AsianDiego VázquezAdoración RuedaPublished in: J. Electron. Test. (2010)
Keyphrases
- frequency domain
- analog circuits
- spatial domain
- fourier transform
- cross correlation
- feature extraction
- frequency domain analysis
- fourier domain
- frequency analysis
- frequency response
- discrete fourier transform
- power spectrum
- neural network
- fault diagnosis
- subband
- frequency spectrum
- spectrum analysis
- power spectra
- power spectral
- fourier analysis
- digital circuits
- denoising
- multiresolution
- image processing
- artificial intelligence