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Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures.
Manuel J. Barragan Asian
Rafaella Fiorelli
Gildas Léger
Adoración Rueda
José L. Huertas
Published in:
J. Electron. Test. (2011)
Keyphrases
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ensemble learning
generalization ability
ensemble methods
ensemble classifier
unlabeled data
mutual subspace method
feature selection
base classifiers
weak learners
test data
support vector machine
labeled data
data sets
prior knowledge
feature space
similarity measure
machine learning