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Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs.
Manuel J. Barragan Asian
Rafaella Fiorelli
Gildas Léger
Adoración Rueda
José L. Huertas
Published in:
Asian Test Symposium (2011)
Keyphrases
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high accuracy
real time
information systems
test data
statistical significance
real world
knowledge base
training data
search algorithm
control system
decision support
test cases
highly accurate
fold cross validation