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Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS.
Amir Zjajo
Manuel J. Barragan Asian
José Pineda de Gyvez
Published in:
IEEE Trans. Instrum. Meas. (2012)
Keyphrases
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low power
power consumption
low cost
high speed
vlsi circuits
single chip
vlsi architecture
digital signal processing
mixed signal
image sensor
high power
ultra low power
design considerations
delay insensitive