Karine Mourgues

Publication Activity (10 Years)

Years Active: 2004-2011
Publications (10 Years): 0

Publications

Loïc Lachèze, Olivier Latry, Pascal Dherbécourt, Karine Mourgues, V. Purohit, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline
Characterization and modeling of hot carrier injection in LDMOS for L-band radar application. Microelectron. Reliab. 51 (8) (2011)
Olivier Latry, Pascal Dherbécourt, Karine Mourgues, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline, Mohamed Masmoudi
A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications. Microelectron. Reliab. 50 (9-11) (2010)
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, M. Gares, Mohamed Masmoudi, Jérôme Marcon
Reliability study of power RF LDMOS device under thermal stress. Microelectron. J. 38 (2) (2007)
M. Gares, Mohamed Ali Belaïd, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Philippe Eudeline
Study of hot-carrier effects on power RF LDMOS device reliability. Microelectron. Reliab. 47 (9-11) (2007)
Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectron. Reliab. 47 (1) (2007)
M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline
Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectron. Reliab. 46 (9-11) (2006)
Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, K. Ketata, Philippe Eudeline
LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. Microelectron. Reliab. 46 (5-6) (2006)
M. Gares, Hichame Maanane, Mohamed Ali Belaïd, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Pierre Bertram, Philippe Eudeline
Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. CCECE (2006)
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. Microelectron. Reliab. 45 (9-11) (2005)
Hichame Maanane, Pierre Bertram, Jérôme Marcon, Mohamed Masmoudi, Mohamed Ali Belaïd, Karine Mourgues, Philippe Eudeline, K. Ketata
Reliability study of Power RF LDMOS for Radar Application. Microelectron. Reliab. 44 (9-11) (2004)