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Reliability study of power RF LDMOS device under thermal stress.
Mohamed Ali Belaïd
K. Ketata
Karine Mourgues
M. Gares
Mohamed Masmoudi
Jérôme Marcon
Published in:
Microelectron. J. (2007)
Keyphrases
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empirical studies
mobile devices
real time
data sets
learning algorithm
data mining
genetic algorithm
mobile robot
statistical analysis
infrared