Jérôme Marcon

Publication Activity (10 Years)

Years Active: 2004-2021
Publications (10 Years): 1

Top Topics

Communication Channels

Top Venues

Publications

Keith Drage, Maridi R. Makaraju, Richard Ejzak, Jérôme Marcon, Roni Even
Negotiation Data Channels Using the Session Description Protocol (SDP). RFC 8864 (2021)
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, M. Gares, Mohamed Masmoudi, Jérôme Marcon
Reliability study of power RF LDMOS device under thermal stress. Microelectron. J. 38 (2) (2007)
M. Gares, Mohamed Ali Belaïd, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Philippe Eudeline
Study of hot-carrier effects on power RF LDMOS device reliability. Microelectron. Reliab. 47 (9-11) (2007)
Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectron. Reliab. 47 (1) (2007)
M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline
Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectron. Reliab. 46 (9-11) (2006)
Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, K. Ketata, Philippe Eudeline
LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. Microelectron. Reliab. 46 (5-6) (2006)
M. Gares, Hichame Maanane, Mohamed Ali Belaïd, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Pierre Bertram, Philippe Eudeline
Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. CCECE (2006)
Mohamed Ali Belaïd, K. Ketata, Mohamed Masmoudi, M. Gares, Hichame Maanane, Jérôme Marcon
Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. Microelectron. Reliab. 46 (9-11) (2006)
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. Microelectron. Reliab. 45 (9-11) (2005)
Hichame Maanane, Pierre Bertram, Jérôme Marcon, Mohamed Masmoudi, Mohamed Ali Belaïd, Karine Mourgues, Philippe Eudeline, K. Ketata
Reliability study of Power RF LDMOS for Radar Application. Microelectron. Reliab. 44 (9-11) (2004)