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Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.
Mohamed Ali Belaïd
K. Ketata
M. Gares
Karine Mourgues
Mohamed Masmoudi
Jérôme Marcon
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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comparative analysis
high speed
semi quantitative
radio frequency
high frequency
software reliability
relevance feedback
statistical tests
reliability analysis
older adults
mobile robot
test data
low power
failure rate
reliability assessment