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Study of hot-carrier effects on power RF LDMOS device reliability.

M. GaresMohamed Ali BelaïdHichame MaananeMohamed MasmoudiJérôme MarconKarine MourguesPhilippe Eudeline
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • empirical studies
  • website
  • genetic algorithm
  • case study
  • multiscale
  • power consumption
  • simulation study
  • individual differences
  • positive effects