Login / Signup

Hot carrier reliability of RF N- LDMOS for S Band radar application.

M. GaresHichame MaananeMohamed MasmoudiPierre BertramJérôme MarconMohamed Ali BelaïdKarine MourguesC. TolantPhilippe Eudeline
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • key technologies
  • data sets
  • databases
  • learning algorithm
  • search engine
  • social networks
  • information systems
  • decision support
  • infrared
  • application specific