Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests.
Mohamed Ali BelaïdK. KetataMohamed MasmoudiM. GaresHichame MaananeJérôme MarconPublished in: Microelectron. Reliab. (2006)
Keyphrases
- power distribution
- parameter estimation
- power grid
- parameter values
- equivalent circuit
- maximum likelihood
- power transmission
- active power
- sensitivity analysis
- transmission line
- parameter settings
- parameter space
- electrical power
- electrical energy
- measurement data
- data sets
- reactive power compensation
- operating conditions
- transfer function
- power consumption
- steady state
- power system
- expectation maximization
- input data
- markov random field
- supply chain
- active learning
- image sequences