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A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications.
Olivier Latry
Pascal Dherbécourt
Karine Mourgues
Hichame Maanane
Jean Pierre Sipma
F. Cornu
Philippe Eudeline
Mohamed Masmoudi
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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radio frequency
relevance feedback
daily life
statistical significance
database
real time
artificial intelligence
website
case study
statistical tests
high density