Jim Tschanz

Publication Activity (10 Years)

Years Active: 2009-2023
Publications (10 Years): 5

Top Topics

Metal Oxide Semiconductor

Noise Suppression

Gate Dielectrics

Top Venues

VLSI Technology and Circuits

Publications

Charles Augustine, Pascal Meinerzhagen, Wootaek Lim, A. Veerabathini, M. Bright, K. Mojjada, Jim Tschanz, Muhammad M. Khellah, Vivek De
A 2.6 mV/b Resolution, 1.2 GHz Throughput, All-Digital Voltage Droop Monitor Using Coupled Ring Oscillators in Intel 4 CMOS. VLSI Technology and Circuits (2023)
Vida Ilderem, Stefano Pellerano, Jim Tschanz, Tanay Karnik, Vivek De
Innovations for Intelligent Edge. ESSCIRC (2022)
Jaydeep P. Kulkarni, Andres Malavasi, Charles Augustine, Carlos Tokunaga, Jim Tschanz, Muhammad M. Khellah, Vivek De
Low Swing and Column Multiplexed Bitline Techniques for Low-Vmin, Noise-Tolerant, High-Density, 1R1W 8T-Bitcell SRAM in 10nm FinFET CMOS. VLSI Circuits (2020)
Somnath Paul, Turbo Majumder, Charles Augustine, Andres F. Malavasi, S. Usirikayala, R. Kumar, Jisna Kollikunnel, S. Chhabra, Satish Yada, M. L. Barajas, C. Ornelas, Dan Lake, Muhammad M. Khellah, Jim Tschanz, Vivek De
A 0.05pJ/Pixel 70fps FHD 1Meps Event-Driven Visual Data Processing Unit. VLSI Circuits (2020)
Harish Kumar Krishnamurthy, Vaibhav A. Vaidya, Sheldon Weng, Krishnan Ravichandran, Pavan Kumar, Stephen T. Kim, Rinkle Jain, George E. Matthew, Jim Tschanz, Vivek De
20.1 A digitally controlled fully integrated voltage regulator with on-die solenoid inductor with planar magnetic core in 14nm tri-gate CMOS. ISSCC (2017)
Ahmed M. Ammar, Rafik Guindi, Ethan Shih, Carlos Tokunaga, Jim Tschanz, Muhammad M. Khellah
A fully integrated charge sharing active decap scheme for power supply noise suppression. SoCC (2015)
Chia-Hsiang Chen, Keith A. Bowman, Charles Augustine, Zhengya Zhang, Jim Tschanz
Minimum supply voltage for sequential logic circuits in a 22nm technology. ISLPED (2013)
Keith A. Bowman, Carlos Tokunaga, Tanay Karnik, Vivek K. De, Jim Tschanz
A 22nm dynamically adaptive clock distribution for voltage droop tolerance. VLSIC (2012)
Arijit Raychowdhury, Jim Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De
Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops. IEEE J. Emerg. Sel. Topics Circuits Syst. 1 (3) (2011)
Yu Cao, Jim Tschanz, Pradip Bose
Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design. IEEE Des. Test Comput. 26 (6) (2009)