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Low Swing and Column Multiplexed Bitline Techniques for Low-Vmin, Noise-Tolerant, High-Density, 1R1W 8T-Bitcell SRAM in 10nm FinFET CMOS.

Jaydeep P. KulkarniAndres MalavasiCharles AugustineCarlos TokunagaJim TschanzMuhammad M. KhellahVivek De
Published in: VLSI Circuits (2020)
Keyphrases
  • high density
  • noise tolerant
  • power consumption
  • low cost
  • data center
  • semi supervised
  • supervised learning