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Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design.
Yu Cao
Jim Tschanz
Pradip Bose
Published in:
IEEE Des. Test Comput. (2009)
Keyphrases
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computer aided
circuit design
information systems
case study
design principles
database
real time
real world
artificial intelligence
user interface
high speed
design process
design decisions
cmos technology