Hiroki Wada

Publication Activity (10 Years)

Years Active: 2000-2022
Publications (10 Years): 3

Top Topics

Quantum Mechanics

Evaluation Measures

Top Venues

IEEE Robotics Autom. Lett.

Publications

Kyoka Nakano, Hiroki Wada, Yoshiyuki Yokoyama, Takeshi Hayakawa
Lift-off Process of On-chip Micro-Gel Actuator for Cell Manipulations. MHS (2022)
Yushi Mura, Hiroki Wada
Quantization of Blackjack: Quantum Basic Strategy and Advantage. CoRR (2020)
Hiroki Wada, Yuha Koike, Yoshiyuki Yokoyama, Takeshi Hayakawa
Evaluation of the Response Characteristics of On-Chip Gel Actuators for Various Single Cell Manipulations. IEEE Robotics Autom. Lett. 5 (4) (2020)
Hiroki Wada, Hidetoshi Oya, Kojiro Hagino, Yasumitsu Ebinuma
Observer-Based Robust Stabilizing Controllers Based on the Trajectory for Polytopic Uncertain Systems. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (6) (2010)
Hao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Masao Hotta
A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS. ASP-DAC (2007)
Hao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada
A Second-Order Multibit Complex Bandpass DeltaSigmaAD Modulator with I, Q Dynamic Matching and DWA Algorithm. IEICE Trans. Electron. (6) (2007)
Hao San, Akira Hayakawa, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Kazuyuki Kobayashi, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada
Complex Bandpass DeltaSigmaAD Modulator Architecture without I, Q-Path Crossing Layout. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (4) (2006)
Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. Asian Test Symposium (2001)
Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara
A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. ASP-DAC (2001)
Hiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara
Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. VLSI Design (2000)
Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara
Single-control testability of RTL data paths for BIST. Asian Test Symposium (2000)
Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
A non-scan DFT method at register-transfer level to achieve complete fault efficiency. ASP-DAC (2000)