Single-control testability of RTL data paths for BIST.
Toshimitsu MasuzawaMinoru IzutsuHiroki WadaHideo FujiwaraPublished in: Asian Test Symposium (2000)
Keyphrases
- data sets
- high dimensional data
- data points
- data sources
- data structure
- data distribution
- data collection
- application domains
- experimental data
- data analysis
- high quality
- database
- raw data
- original data
- data quality
- spatial data
- synthetic data
- real time
- data mining techniques
- knowledge discovery
- control system
- genetic algorithm
- data processing
- input data
- small number
- data mining algorithms
- prior knowledge
- metadata
- data mining