BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths.
Ken-ichi YamaguchiHiroki WadaToshimitsu MasuzawaHideo FujiwaraPublished in: Asian Test Symposium (2001)
Keyphrases
- synthetic data
- data sets
- input data
- missing data
- prior knowledge
- data analysis
- information loss
- database
- cost function
- data points
- high accuracy
- data quality
- noisy data
- original data
- data acquisition
- test data
- correlation analysis
- detection method
- training samples
- data collection
- training data
- significant improvement
- control policy
- neural network
- high quality
- data structure
- preprocessing
- missing values
- segmentation method
- data sources
- classification accuracy
- probability distribution
- data mining techniques
- mathematical model
- data distribution
- pairwise
- high dimensional data
- prior information
- support vector machine
- statistical analysis
- user input
- data processing