A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability.
Satoshi OhtakeShintaro NagaiHiroki WadaHideo FujiwaraPublished in: ASP-DAC (2001)
Keyphrases
- detection method
- high accuracy
- preprocessing
- objective function
- computationally efficient
- experimental evaluation
- mathematical model
- computational efficiency
- neural network
- computational complexity
- significant improvement
- cost function
- synthetic data
- high efficiency
- data sets
- classification method
- discrete fourier transform
- clustering method
- high speed
- dynamic programming
- pairwise
- multiscale
- similarity measure
- feature extraction
- image processing