Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency.
Hiroki WadaToshimitsu MasuzawaKewal K. SalujaHideo FujiwaraPublished in: VLSI Design (2000)
Keyphrases
- data sets
- data analysis
- data sources
- data collection
- original data
- prior knowledge
- training data
- statistical methods
- high dimensional data
- data acquisition
- high quality
- software development
- small number
- database
- computer systems
- knowledge based systems
- knowledge discovery
- synthetic data
- missing data
- sensor data
- data distribution
- data points
- end users
- databases
- data quality
- data reduction
- data integrity