Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.
Hiroyuki YotsuyanagiMasaki HashizumeToshiyuki TsutsumiKoji YamazakiTakashi AikyoYoshinobu HigamiHiroshi TakahashiYuzo TakamatsuPublished in: VLSI Design (2009)
Keyphrases
- fault diagnosis
- fault detection
- fault model
- multiple faults
- fault detection and isolation
- vibration signal
- expert systems
- signal processing
- non stationary
- fault detection and diagnosis
- neural network
- straight line
- hough transform
- high speed
- test cases
- frequency domain
- condition monitoring
- compressive sensing
- low cost
- integrated circuit
- high frequency
- operating conditions
- industrial processes
- fault models
- image processing
- fault isolation
- original signal
- line segments
- signal detection
- multiresolution
- root cause
- radio frequency
- error detection
- wavelet analysis
- control system