A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs.
WidiantoMasaki HashizumeShohei SuenagaHiroyuki YotsuyanagiAkira OnoShyue-Kung LuZvi RothPublished in: IEICE Trans. Inf. Syst. (2016)
Keyphrases
- printed circuit boards
- integrated circuit
- test cases
- visual inspection
- test data
- statistical tests
- software testing
- high speed
- test generation
- manufacturing process
- test data generation
- test sequences
- test suite
- computer vision
- model based testing
- testing process
- quality control
- computer aided
- steady state
- image segmentation
- real time
- hardware software co design