Enhancement of Clock Delay Faults Testing.
Yoshinobu HigamiHiroshi TakahashiShin-ya KobayashiKewal K. SalujaPublished in: ETS (2011)
Keyphrases
- neural network
- fault diagnosis
- test cases
- fault model
- image enhancement
- power consumption
- fault detection
- high speed
- test data
- test generation
- database
- image processing
- test set
- object oriented
- video sequences
- end to end
- statistical tests
- knowledge base
- test sequences
- condition monitoring
- abnormal events
- data mining
- fault detection and isolation
- mutation testing