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Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests.
Marwan A. Gharaybeh
Michael L. Bushnell
Vishwani D. Agrawal
Published in:
J. Electron. Test. (1997)
Keyphrases
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test generation
test cases
fault diagnosis
mutation testing
fault detection
test sequences
design automation
machine learning
static analysis
fault model
multiple faults
training set
feature extraction
symbolic execution
fault detection and isolation
vision system
expert systems
database systems
image processing