Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes.
Zhuo ZhangSudhakar M. ReddyIrith PomeranzPublished in: ASP-DAC (2007)
Keyphrases
- test cases
- statistical tests
- test generation
- test data
- test suite
- post hoc
- built in self test
- multiple choice
- mutation testing
- fault diagnosis
- model based diagnosis
- fault detection
- software testing
- neural network
- databases
- statistically significant
- training set
- information systems
- artificial intelligence
- information retrieval
- test sequences
- multiple faults
- real time