test vector selection for transistor short fault testing.
Xiaoqing WenHideo TamamotoKozo KinoshitaPublished in: Systems and Computers in Japan (1997)
Keyphrases
- test cases
- software testing
- test suite
- test sequences
- test generation
- high speed
- test data
- testing process
- selection algorithm
- set of test cases
- integration testing
- fault detection
- low power
- model based testing
- usability testing
- real time embedded systems
- multiple faults
- code coverage
- item response theory
- test data generation
- regression testing
- low cost
- statistically significant
- selection strategy
- integrated circuit