A BIST approach to delay fault testing with reduced test length.
Bernd WurthKarl FuchsPublished in: ED&TC (1995)
Keyphrases
- test cases
- software testing
- test generation
- test sequences
- set of test cases
- test data
- test suite
- built in self test
- fault diagnosis
- fault model
- code coverage
- statistical tests
- regression testing
- item response theory
- fault detection
- test data generation
- fault injection
- statistical significance
- maximum number
- expert systems
- integration testing
- information systems
- data sets