DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits.
Joyati MondalDipak Kumar KoleHafizur RahamanDebesh Kumar DasBhargab B. BhattacharyaPublished in: J. Circuits Syst. Comput. (2022)
Keyphrases
- test set
- test cases
- cmos technology
- built in self test
- error rate
- discrete fourier transform
- test data
- training set
- frequency domain
- fault diagnosis
- fault models
- cellular automata
- missing data
- markov chain
- multiple input
- training data
- evaluation methodology
- missing values
- low power
- fault detection
- fault model
- high speed
- random selection
- integrated circuit
- training and test sets
- model based diagnosis
- field effect transistors