Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults.
Conrad J. MoorePeikun WangAmir Masoud GharehbaghiMasahiro FujitaPublished in: ISCAS (2017)
Keyphrases
- fault diagnosis
- test cases
- built in self test
- fault detection
- root cause
- fault model
- multiple faults
- model based diagnosis
- fault detection and isolation
- fault detection and diagnosis
- software testing
- sequential patterns
- multiscale
- data sets
- temporal patterns
- error detection
- test sequences
- data analysis
- website
- machine learning
- neural network