Two Modeling Techniques For CMOS Circuits To Enhance Test Generation And Fault Simulation For Bridging Faults.
Kuen-Jong LeeJing-Jou TangPublished in: Asian Test Symposium (1996)
Keyphrases
- test generation
- test cases
- fault diagnosis
- fault detection
- high speed
- mutation testing
- circuit design
- design automation
- fault models
- multiple faults
- fault model
- analog vlsi
- delay insensitive
- chip design
- test sequences
- fault detection and isolation
- symbolic execution
- vlsi circuits
- software testing
- model based diagnosis
- expert systems
- fault management
- power consumption
- vision system
- repair actions